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M24256-DFDW6TP

M24256-DFDW6TP

M24256-DFMC6TG

Active

256-Kbit serial I2C bus EEPROM

Quantity $ per Unit Savings
1 - 9$0.540%
10 - 24$0.541%
25 - 99$0.508%
100 - 249$0.4419%
250 - 499$0.4320%
500$0.4321%
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Out of stock
$0.54
Parameter NameParameter Value
Supply Voltage Min Volt1.7
Supply Voltage Max Volt5.5
Operating Temp Min Celsius-40.0
Operating Temp Max Celsius85.0
ECCN USEAR99
ECCN EUNEC
Packing TypeTape And Reel
ROHS Compliance GradeEcopack2
GradeIndustrial
Package NameUFDFPN8

The M24256 is a 256-Kbit I2C-compatible EEPROM (electrically erasable programmable memory) organized as 32 K × 8 bits.


The M24256-BW can operate with a supply voltage from 2.5 V to 5.5 V, the M24256-BR AND M24256-DR can operate with a supply voltage from 1.8 V to 5.5 V, and the M24256-BF and M24256-DF can operate with a supply voltage from 1.7 V to 5.5 V. All these devices operate with a clock frequency of 1 MHz (or less), over an ambient temperature range of –40 °C / +85 °C. The M24256-D offers an additional page, named the identification page (64 byte). The identification page can be used to store sensitive application parameters which can be (later) permanently locked in read-only mode.

Key features
  • Packages
    • Compatible with following I2C bus modes:
      • 1 MHz
      • 400 kHz
      • 100 kHz
    • Memory array:
      • 256 Kbit (32 Kbyte) of EEPROM
      • Page size: 64 byte
      • Additional write lockable page (M24256-D order codes)
    • Single supply voltage and high speed:
      • 1 MHz clock from 1.7 V to 5.5 V
    • Write:
      • Byte write within 5 ms
      • Page write within 5 ms
    • Operating temperature range:
      • from -40 °C up to +85 °C
    • Random and sequential read modes
    • Write protect of the whole memory array
    • Enhanced ESD/latch-Up protection
    • More than 4 million write cycles
    • More than 200-years data retention
    • RoHS-compliant and Halogen-free (ECOPACK2)
    • SO8 ECOPACK2
    • TSSOP8 ECOPACK2
    • UFDFPN8 ECOPACK2
    • WLCSP ECOPACK2
    • Unsawn wafer (each die is tested)