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The RHFAHC00 device is a very high speed pure CMOS quad 2-input NAND gate, designed for radiation hardness and characterized in total ionization dose (TID) and single event effect (SEE).
It is available in die-form and in hermetic ceramic Flat 14-lead screened as per MIL-PRF-38535 to comply with the needs of space applications. It can work from -55 °C to +125 °C ambient temperature.