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C65SPACE

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Rad hard 65nm CMOS technology platform for space applications

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Parameter NameParameter Value
GradeIndustrial
Key features
  • Process
    • STMicroelectronics C65SPACE (65nm CMOS)
    • 3.3V IO gate oxide GO2 (5nm)
    • 1.2V core gate oxide GO1 (1.8nm), triple VT transistors
    • 7 copper metallization,5 thin and 2 thick
    • Low-K inter-metallic dielectrics for thin metal layers
    • High density SRAMs
    • Compatible with flip-chip and wire bonding packaging
  • Radiations
    • SEL-free up to LET = 60Mev/mg/cm2 at 125°C Tj and Vdd max
    • SEE hardened library
    • Tested up to a total dose of 300 krads (Si)
  • Reliability
    • Library cells models with 20 years aging
    • Transistor models including aging alteration
    • ESD better than:
      • 2kV in HBM (Class 2 / MIL-STD-883H)
      • 150V in MM
      • 250V in CDM
  • Library offer
    • Comprehensive library of standard logic with PVT and aging corners models
    • IO pad libraries provide interfaces at 3.3V +/-0.30V, 2.5V+/-0.25V and 1.8V +/-0.15V
    • High speed IO Pad LVDS supplied at 2.5V +/-0.25V up to 650Mbps
    • Cold sparing IOs with single/double row support
    • Memories generation: single port SRAM, ROM, Dual port SRAMs, BIST library, EDAC library
    • Wide-range PLLs 1.2GHz with multi-phase outputs
    • 6.25Gbit/s high speed serial links (HSSL)
  • Design flow
    • An ST customized design flow (RTL to GDS) invoking commercial solutions (Synopsys, Cadence, Mentor…) is available for partners and certified design houses:
      • Front-End kit from RTL to gates based
      • SiPKit for IO ring generation
      • FFKit for place and route
      • SignOffKit for final verification before tape-out
    • For customer owned tools (COT) flow, ST provides the C65SPACE design platform along with the DRM and sign-off kit.